Content area

Abstract

Copper wire bonding of microelectronic parts has developed as a means to cut the costs of using the more mature technology of gold wire bonding. However, with this new technology, changes in the bonding processes as well as bonding metallurgy can affect product reliability. This paper discusses the challenges associated with copper wire bonding and the solutions that the industry has been implementing. The paper also provides information to enable customers to conduct qualification and reliability tests on microelectronic packages to facilitate adoption in their target applications.[PUBLICATION ABSTRACT]

Details

Title
Copper Wire Bonding Concerns and Best Practices
Author
Chauhan, Preeti; Zhong, Z W; Pecht, Michael
Pages
2415-2434
Publication year
2013
Publication date
Aug 2013
Publisher
Springer Nature B.V.
ISSN
0361-5235
e-ISSN
1543-186X
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
1403484221
Copyright
TMS 2013