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Copyright International Institute for the Science of Sintering (IISS) May-Aug 2015

Abstract

Properties of CdS thin films were investigated applying atomic force microscopy (AFM) and Raman spectroscopy. CdS thin films were prepared by using thermal evaporation technique under base pressure 2 x 10^sup -5^ torr. The quality of these films was investigated by AFM spectroscopy. We apply Raman scattering to investigate optical properties of CdS thin films, and reveal existence of surface optical phonon (SOP) mode at 297 cm^sup -1^. Effective permittivity of mixture were modeled by Maxwell - Garnet approximation.

Details

Title
Raman Spectroscopy of Optical Properties In Cds Thin Films
Author
Trajic, J; Gilic, M; Romcevic, N; Romcevic, M; Stanisic, G; Hadzic, B; Petrovic, M; Yahia, Y S
Pages
145-152
Publication year
2015
Publication date
May-Aug 2015
Publisher
International Institute for the Science of Sintering (IISS)
ISSN
0350820X
e-ISSN
18207413
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
1705546450
Copyright
Copyright International Institute for the Science of Sintering (IISS) May-Aug 2015