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Atomic-Scale STEM-EELS Characterization of the Chemistry of Structural Defects and Interfaces in Energy-Related Materials
Ramasse, Q M; Azough, F; Freer, R; Kepaptsoglou, D M; Mainz, R
; et al.
Microscopy and Microanalysis, suppl. S3; Oxford Vol. 20, (Aug 2014): 562-563.
DOI:10.1017/S143192761400453X

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