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Using In-Situ TEM to Characterize the Microstructure Evolution of Metallic Systems under External Solicitation
Kaoumi, D; Gautier, T; Adamson, J; Kirk, M.
Microscopy and Microanalysis, suppl. S3; Oxford Vol. 21, (Aug 2015): 111-112.
DOI:10.1017/S143192761500135X

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