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Abstract
Layered-structure materials are currently relevant given their quasi-2D nature. Knowledge of their physical properties is currently of major interest. Niobium ditelluride possesses a monoclinic layered-structure with a distortion in the tellurium planes. This structural complexity has hindered the determination of its fundamental physical properties. In this work, NbTe2 crystals were used to elucidate its structural, compositional, electronic and vibrational properties. These findings have been compared with calculations based on density functional theory. The chemical composition and elemental distribution at the nanoscale were obtained through atom probe tomography. Ultraviolet photoelectron spectroscopy allowed the first determination of the work function of NbTe2. Its high value, 5.32 eV, and chemical stability allow foreseeing applications such as contact in optoelectronics. Raman spectra were obtained using different excitation laser lines: 488, 633, and 785 nm. The vibrational frequencies were in agreement with those determined through density functional theory. It was possible to detect a theoretically-predicted, low-frequency, low-intensity Raman active mode not previously observed. The dispersion curves and electronic band structure were calculated, along with their corresponding density of states. The electrical properties, as well as a pseudo-gap in the density of states around the Fermi energy are characteristics proper of a semi metal.
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Details
1 Centro de Investigación y de estudios Avanzados del IPN, Unidad Querétaro, Libramiento Norponiente No 2000, Frac., Real de Juriquilla, C.P., Mexico
2 Department of Physics, Simon Fraser University, Burnaby, British Columbia, Canada
3 Centro de Investigación en Materiales Avanzados, Unidad Monterrey, Apodaca, Nuevo León, Mexico
4 Max-Planck-Insitut für Eisenforschung GmbH, Düsseldorf, Germany
5 Centro de Investigación en Materiales Avanzados, Miguel de Cervantes 120, Complejo Industrial Chihuahua, Chihuahua, Chih., Mexico
6 Ontario Centre for Characterization of Advanced Materials, University of Toronto, Toronto, Ontario, Canada
7 The Edward S. Rogers Sr. Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada
8 The Edward S. Rogers Sr. Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada; Department of Material Science and Engineering, University of Toronto, Toronto, Ontario, Canada




