Content area

Abstract

Figure 3 shows the comparison of the power-up simulation results based on AMS behavioral models and transistor level simulation. The simulation results shown in this figure indicate the behavioral models match the transistor-level simulation well. However, the computer time used for the AMS behavioral simulation is drastically less than the time required for the transistor-level simulation, and this reduced simulation time enables a fast verification of this complex system.

Details

1007133
Business indexing term
Title
A Unified Approach to Portable Power IC Verification
Publication title
Volume
13
Issue
8
Pages
22-28
Number of pages
3
Publication year
2005
Publication date
Aug 2005
Section
FEATURED TECHNOLOGY
Publisher
Advantage Business Media
Place of publication
Rockaway
Country of publication
United States
Publication subject
ISSN
10764240
Source type
Trade Journal
Language of publication
English
Document type
Feature
Document feature
graphs; illustrations; diagrams; references
ProQuest document ID
218933364
Document URL
https://www.proquest.com/trade-journals/unified-approach-portable-power-ic-verification/docview/218933364/se-2?accountid=208611
Copyright
Copyright Reed Business Information, a division of Reed Elsevier, Inc. Aug 2005
Last updated
2024-12-01
Database
ProQuest One Academic