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TEM Characterization of Crept and Irradiated Nano-structured Ferritic Alloys
Bentley, J; Hoelzer, DT; Busby, JT; Certain, AG; Allen, TR
; et al.
Microscopy and Microanalysis, suppl. yes; Oxford Vol. 15, Iss. S2, (Jul 2009): 1350-1351.
DOI:10.1017/S1431927609095828

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