Abstract

High-entropy alloys (HEAs) are promising materials for next-generation applications because of their mechanical properties, excellent high-temperature stability, and resistance against oxidation and corrosion. Although many researchers have investigated high-temperature HEA applications, few have considered low-temperature applications. Here we demonstrate an unprecedented intermetallic compound of (Fe, Cr, Co, Ni, Cu)Sn2 at the interface between Sn-3.0Ag-0.5Cu (SAC) solder and FeCoNiCrCu0.5 HEA substrate after reflow at 400 °C. Significantly suppressed growth of intermetallic compound without detachment from the substrate was observed during thermal aging at 150 °C for 150 h. Sn grains with an average grain size of at least 380 μm are observed. The results reveal a completely new application for the fields of Sn-Ag-Cu solder and HEA materials.

Details

Title
Suppressed Growth of (Fe, Cr, Co, Ni, Cu)Sn2 Intermetallic Compound at Interface between Sn-3.0Ag-0.5Cu Solder and FeCoNiCrCu0.5 Substrate during Solid-state Aging
Author
Yu-An, Shen 1 ; Chun-Ming, Lin 2 ; Li, Jiahui 3 ; Gao, Runhua 3 ; Nishikawa, Hiroshi 1 

 Joining and Welding Research Institute (JWRI), Osaka University, Osaka, Japan 
 Department of Mechanical Engineering, Minghsin University of Science and Technology, Hsinchu, Taiwan, Republic of China; Department of Aviation Mechanical Engineering, China University of Science and Technology, Hsinchu, Taiwan, Republic of China 
 Joining and Welding Research Institute (JWRI), Osaka University, Osaka, Japan; Graduate School of Engineering, Osaka University, Osaka, Japan 
Pages
1-5
Publication year
2019
Publication date
Jul 2019
Publisher
Nature Publishing Group
e-ISSN
20452322
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2258130766
Copyright
© 2019. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.