Content area

Abstract

Currently only glass bonding thick film conductor systems are commercially available for metallizing AlN-ceramic. The glass phase formed between metallization and ceramic impairs the high thermal conductivity of AlN. A new glass frit free metallization system has been developed utilizing the bonding mechanism of active brazing to provide the adhesion of metallization onto the ceramic. Aspects of paste preparation range from the derivation of the metallic powder to the selection of an appropriate printing vehicle which must decompose completely during the firing process under an inert atmosphere. The adhesion strength of the new paste system with the alternative bonding mechanism has been evaluated and contrasted with that of standard thick film pastes.

Details

Title
Development of Glass Frit Free Metallization Systems for AIN
Author
Adlaßnig, A 1 ; Schuster, J C 1 ; Reicher, R 2 ; Smetana, W 2 

 Institut für physikalische Chemie,, Universitä Wien,, Wien,, Austria 
 Institut für Werkstoffe der Elektrotechnik,, Technische Universität Wien,, Wien,, Austria 
Pages
4887-4892
Publication year
1998
Publication date
Oct 1998
Publisher
Springer Nature B.V.
ISSN
00222461
e-ISSN
15734803
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2259791804
Copyright
Journal of Materials Science is a copyright of Springer, (1998). All Rights Reserved.