Content area
Abstract
In the present study, the leucite growth of a low-fusing dental ceramic has been investigated by high temperature X-ray diffraction analysis. The process involved two heating and cooling cycles, starting with a totally amorphous powder. Maximum leucite growth has been detected via intensity and FWHM (Full Width at the Half Maximum) analysis of the X-ray reflections at a temperature of approximately 670°C upon cooling the sample, thus indicating a maximum CTE (Coefficient of Thermal Expansion) 110°C below the recommended firing temperature of the sample.
Details
Title
High-temperature X-ray diffraction analysis of a low-fusing dental ceramic
Author
Assmann, S 1 ; Ermrich, M 2 ; Kunzmann, K 3
1 Degussa Dental GmbH & Co. KG, Rosbach, Germany
2 X-ray Laboratory Dr. Ermrich, Reinheim, Germany
3 INFRACOR GmbH, Hanau, Germany
1 Degussa Dental GmbH & Co. KG, Rosbach, Germany
2 X-ray Laboratory Dr. Ermrich, Reinheim, Germany
3 INFRACOR GmbH, Hanau, Germany
Pages
5403-5406
Publication year
2001
Publication date
Nov 2001
ISSN
00222461
e-ISSN
15734803
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2260116440
Copyright
Journal of Materials Science is a copyright of Springer, (2001). All Rights Reserved.