Content area

Abstract

The paper presents a new image template matching method for component inspection of electronic assembly systems. To recognize incorrectly assembled components, the input image of the components is matched with standard images, using a template matching algorithm. To produce a rapid inspection system, the processing time of the matching algorithm should be minimized. Since the standard images of all components located in a PCB are stored in the computer, it is desirable to minimize the memory size of the standard image. The discrete wavelet transformation is applied to minimize the image size as well as the processing time. Only 7% memory of the BMP image is used to discriminate between how well, or not, the components have been assembled. Comparative results are presented to verify the usefulness of the new proposed method.

Details

Title
Wavelet transform based image template matching for automatic component inspection
Author
Han-Jin, Cho 1 ; Park, Tae-Hyoung 1 

 Department of Control and Robot Engineering, Chungbuk National University, Cheongju, Chungbuk, South Korea 
Pages
1033-1039
Publication year
2010
Publication date
Oct 2010
Publisher
Springer Nature B.V.
ISSN
02683768
e-ISSN
14333015
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2262439343
Copyright
The International Journal of Advanced Manufacturing Technology is a copyright of Springer, (2010). All Rights Reserved.