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Abstract

The intention of this paper is to introduce and share classroom empirical knowledge on Synopsys TetraMax, an Automatic Test Pattern Generation (ATPG) for design verification and testing of digital logic circuits. TetraMax is an ATPG tool used by the largest innovative silicon companies globally to generate test vectors automatically for design verification of Application-Specific Integrated Circuits (ASIC). TetraMax is the leading tool for generating minimum test patterns possible that covers maximum test coverage for a wide range of designs. The unparalleled ease-of-use and high performance provided by TetraMax allows designers to create efficient, compact test for even the most complex designs in minimal time. Normally, Computer Engineering curriculum does not include courses beyond their fundamental digital logic courses. We have developed a course “Digital Systems Testing and Testable Design”; for students of Computer Engineering who want to be specialized in the design, verification and testing side of VLSI circuits. We will share our knowledge gained through building and configuring Synopsys tools and their application for the design, verification and testing of VLSI circuits in the course. The career field of VLSI verification and test offers excellent opportunities for fresh engineering graduates. Training students to apply theoretical concepts with verified industry tools allows them to gain a deeper level of knowledge of VLSI design, verification and testing. Therefore, enabling them to become career ready upon graduation. This pedagogical experience of course covering the fundamentals of VLSI test process and automatic test equipment (ATE), test economics, faults, fault modeling and fault simulation in conjunction with the empirical learning of Synopsys tools for ATPG will be discussed in the body of the paper along with a results and analysis of a basic example.

Details

Title
Empirical Learning of Digital Systems Testing and Testable Design Using Industry-Verified Electronics Design Automation Tools in Classroom
Source details
Conference: 2017 Pacific Southwest Section Meeting; Location: Tempe, Arizona; Start Date: April 20, 2017; End Date: April 22, 2017
Publication year
2017
Publication date
Apr 20, 2017
Publisher
American Society for Engineering Education-ASEE
Place of publication
Atlanta
Country of publication
United States
Source type
Conference Paper
Language of publication
English
Document type
Conference Proceedings
Publication history
 
 
Online publication date
2017-07-20
Publication history
 
 
   First posting date
20 Jul 2017
ProQuest document ID
2317686350
Document URL
https://www.proquest.com/conference-papers-proceedings/empirical-learning-digital-systems-testing/docview/2317686350/se-2?accountid=208611
Copyright
© 2017. Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the associated terms available at https://peer.asee.org/about .
Last updated
2025-11-14
Database
ProQuest One Academic