Content area

Abstract

Although various researched works have been carried out in x-ray crystallography and its applications, but there are still limited number of researches on crystallographic theories and industrial application of x-ray diffraction. The present study reviewed and provided detailed discussion on atomic arrangement of single crystals, mathematical concept of Bravais, reciprocal lattice, and application of x-ray diffraction. Determination of phase identification, crystal structure, dislocation density, crystallographic orientation, and gran size using x-ray diffraction peak intensity, peak position, and peak width were discussed. The detailed review of crystallographic theories and x-ray diffraction application would benefit majorly engineers and specialists in chemical, mining, iron, and steel industries.

Details

Title
A review of basic crystallography and x-ray diffraction applications
Author
Ameh, E S 1 

 Department of Mechanical Engineering, University of Benin, Benin, Edo State, Nigeria 
Pages
3289-3302
Publication year
2019
Publication date
Dec 2019
Publisher
Springer Nature B.V.
ISSN
02683768
e-ISSN
14333015
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2317799853
Copyright
The International Journal of Advanced Manufacturing Technology is a copyright of Springer, (2019). All Rights Reserved.