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© 2020. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Fixed pattern noise (FPN) has always been an important factor affecting the imaging quality of CMOS image sensor (CIS). However, the current scene-based FPN removal methods mostly focus on the image itself, and seldom consider the structure information of the FPN, resulting in various undesirable noise removal effects. This paper presents a scene-based FPN correction method: the low rank sparse variational method (LRSUTV). It combines not only the continuity of the image itself, but also the structural and statistical characteristics of the stripes. At the same time, the low frequency information of the image is combined to achieve adaptive adjustment of some parameters, which simplifies the process of parameter adjustment, to a certain extent. With the help of adaptive parameter adjustment strategy, LRSUTV shows good performance under different intensity of stripe noise, and has high robustness.

Details

Title
CMOS Fixed Pattern Noise Removal Based on Low Rank Sparse Variational Method
Author
Zhang, Tao; Li, Xinyang; Li, Jianfeng; Xu, Zhi
First page
3694
Publication year
2020
Publication date
2020
Publisher
MDPI AG
e-ISSN
20763417
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2408345695
Copyright
© 2020. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.