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Abstract
Spectrally resolved photoacoustic imaging is promising for label-free imaging in optically scattering materials. However, this technique often requires acquisition of a separate image at each wavelength of interest. This reduces imaging speeds and causes errors if the sample changes in time between images acquired at different wavelengths. We demonstrate a solution to this problem by using dual-comb spectroscopy for photoacoustic measurements. This approach enables a photoacoustic measurement at thousands of wavelengths simultaneously. In this technique, two optical-frequency combs are interfered on a sample and the resulting pressure wave is measured with an ultrasound transducer. This acoustic signal is processed in the frequency-domain to obtain an optical absorption spectrum. For a proof-of-concept demonstration, we measure photoacoustic signals from polymer films. The absorption spectra obtained from these measurements agree with those measured using a spectrophotometer. Improving the signal-to-noise ratio of the dual-comb photoacoustic spectrometer could enable high-speed spectrally resolved photoacoustic imaging.
Spectrally resolved photoacoustic images often require the acquisition of data for each wavelength separately. Here, the authors use dual frequency-comb spectroscopy for photoacoustic measurements, enabling spectrally resolved measurements without the need to scan the illumination wavelength.
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Details
; Herman, Daniel I 6 ; Hoenig, Eli V 7 ; Hwang Jeeseong 8 ; Newbury, Nathan R 8 ; Perez, Edgar F 9 ; Yung, Christopher S 10
; Coddington, Ian 10 ; Cossel, Kevin C 10
1 Applied Physics Division, National Institute of Standards and Technology, Boulder, USA
2 Applied Physics Division, National Institute of Standards and Technology, Boulder, USA; University of Colorado, Department of Physics, Boulder, USA (GRID:grid.266190.a) (ISNI:0000000096214564)
3 Applied Physics Division, National Institute of Standards and Technology, Boulder, USA (GRID:grid.266190.a)
4 Applied Physics Division, National Institute of Standards and Technology, Boulder, USA (GRID:grid.266190.a); University of Colorado, Department of Physics, Boulder, USA (GRID:grid.266190.a) (ISNI:0000000096214564); University of New Mexico, Optical Science and Engineering, Albuquerque, USA (GRID:grid.266832.b) (ISNI:0000 0001 2188 8502)
5 Applied Physics Division, National Institute of Standards and Technology, Boulder, USA (GRID:grid.266832.b); University of Colorado, Department of Physics, Boulder, USA (GRID:grid.266190.a) (ISNI:0000000096214564)
6 Applied Physics Division, National Institute of Standards and Technology, Boulder, USA (GRID:grid.266190.a); University of Colorado, Department of Physics, Boulder, USA (GRID:grid.266190.a) (ISNI:0000000096214564)
7 Applied Physics Division, National Institute of Standards and Technology, Boulder, USA (GRID:grid.266190.a); University of Colorado, Department of Physics, Boulder, USA (GRID:grid.266190.a) (ISNI:0000000096214564); University of Chicago, Pritzker School of Molecular Engineering, Chicago, USA (GRID:grid.170205.1) (ISNI:0000 0004 1936 7822)
8 Applied Physics Division, National Institute of Standards and Technology, Boulder, USA (GRID:grid.170205.1)
9 Applied Physics Division, National Institute of Standards and Technology, Boulder, USA (GRID:grid.170205.1); University of Colorado, Department of Physics, Boulder, USA (GRID:grid.266190.a) (ISNI:0000000096214564); University of Maryland, Institute for Research in Electronics and Applied Physics, College Park, USA (GRID:grid.164295.d) (ISNI:0000 0001 0941 7177)
10 Applied Physics Division, National Institute of Standards and Technology, Boulder, USA (GRID:grid.164295.d)




