It appears you don't have support to open PDFs in this web browser. To view this file, Open with your PDF reader
Abstract
The thermal deformation microstructure of continuous extrusion copper bus bar was observed and analyzed in the temperature range from 200°C to 700°C and at strain rate from 0.01s-1 to 10.0s-1 and at deformation amount from30% to 90% on Gleeble1500 test machine. The experiment results show that the higher the temperature, the lower the strain rate, the more dynamic recrystallization occurred. At the same strain rate, the copper bus bar changes from raw material of as-cast organization to recrystallization grain gradually as the deformation temperature and deformation degree increase, and the recrystallization grain size grows older with the rise of temperature. At the same deformation temperature, the temperature of recrystallization nucleation decreases while the strain rate increases. At low strain rate (0.01~1.0s-1), the dynamic recrystallization occurred at 500°C. While at high strain rate (10.0s-1), the recrystallization nucleation is advanced and it is already completed at 500°C. The Z parameters can be used to express the effect of deformation temperature and strain rate on the average grain size D, and the prediction model of the thermal deformation microstructure is obtained as follows: lnD=4.822-0.018lnZ
You have requested "on-the-fly" machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Show full disclaimer
Neither ProQuest nor its licensors make any representations or warranties with respect to the translations. The translations are automatically generated "AS IS" and "AS AVAILABLE" and are not retained in our systems. PROQUEST AND ITS LICENSORS SPECIFICALLY DISCLAIM ANY AND ALL EXPRESS OR IMPLIED WARRANTIES, INCLUDING WITHOUT LIMITATION, ANY WARRANTIES FOR AVAILABILITY, ACCURACY, TIMELINESS, COMPLETENESS, NON-INFRINGMENT, MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. Your use of the translations is subject to all use restrictions contained in your Electronic Products License Agreement and by using the translation functionality you agree to forgo any and all claims against ProQuest or its licensors for your use of the translation functionality and any output derived there from. Hide full disclaimer





