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© 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

The non-uniform response in infrared focal plane array (IRFPA) detectors inevitably produces corrupted images with a fixed-pattern noise. In this paper, we present a novel and adaptive scene-based non-uniformity correction (NUC) method called Correction method with Statistical scene-based and Interframe Registration (CSIR), which realizes low delay calculation of correction coefficient for infrared image. This method combines the statistical method and registration method to achieve a better NUC performance. Specifically, CSIR estimates the gain coefficient with statistical method to give registration method an appropriate initial value. This combination method not only reduces the need of interactive pictures, which means lower time delay, but also achieves better performance compared to the statistical method and other single registration methods. To verify this, real non-uniformity infrared image sequences collected by ourselves were used, and the advantage of CSIR was compared thoroughly on frame number (corresponding to delay time) and accuracy. The results show that the proposed method could achieve a significantly fast and reliable fixed-pattern noise reduction with the effective gain and offset.

Details

Title
Statistical Scene-Based Non-Uniformity Correction Method with Interframe Registration
Author
Lv, Baolin 1 ; Tong, Shoufeng 2 ; Liu, Qiaoyuan 3 ; Sun, Haijiang 3 

 School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun 130033, China; [email protected]; Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China; [email protected] (Q.L.); [email protected] (H.S.) 
 School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun 130033, China; [email protected] 
 Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China; [email protected] (Q.L.); [email protected] (H.S.) 
First page
5395
Publication year
2019
Publication date
2019
Publisher
MDPI AG
e-ISSN
14248220
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2535493195
Copyright
© 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.