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Analysis of distribution of critical current of bent-damaged Bi2223 composite tape
Ochiai, S; Okuda, H; Sugano, M; Hojo, M; Osamura, K
; et al.
IOP Conference Series. Materials Science and Engineering; Bristol Vol. 18, Iss. 15, (Oct 2011).
DOI:10.1088/1757-899X/18/15/152002
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