Abstract

The in-field orientation dependence of critical current and n-value in second generation high temperature superconductive tapes was investigated. The samples were manufactured by Metalorganic Chemical Vapour Deposition method with BaZrO3 inclusions (SuperPower Inc.) and Pulsed Laser Deposition method (Bruker HTS). For samples of each kind of fabrication techniques we observed higher critical current value in the case of external magnetic field aligned along (or nearby) c-axis direction in comparison with one aligned along ab-plane. We analysed possible reasons for this effect. Angular dependences of the critical current and n-value were investigated. The microstructure images of superconductive layer of studied samples show tilt of BaZrO3 nanorods in MOCVD sample and high density of structural defects for PLD sample.

Details

Title
Variation of critical current and n-value of 2G HTS tapes in external magnetic fields of different orientation
Author
Sychugov, V V 1 ; Degtyarenko, P N 2 ; Ovcharov, A V 1 ; Shavkin, S V 1 ; Kruglov, V S 1 ; Vasiliev, A L 1 ; Volkov, P V 1 ; Chesnokov, Yu M 1 

 National Research Centre "Kurchatov Institute", Akademika Kurchatova pl. 1, 123182 Moscow, Russia 
 National Research Centre "Kurchatov Institute", Akademika Kurchatova pl. 1, 123182 Moscow, Russia; Joint Institute for High Temperatures of Russian Academy of Sciences, Izhorskaya st. 13 Bd.2, 125412 Moscow, Russia; National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe sh. 31, 115409 Moscow, Russia 
Publication year
2016
Publication date
Sep 2016
Publisher
IOP Publishing
ISSN
17426588
e-ISSN
17426596
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2575202005
Copyright
© 2016. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.