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Abstract
The purpose of this study is to identify the factors that can affect the effectiveness of the Yield Management training program at a semiconductor company. The research framework for this study was designed based on the Kirkpatrick model and questionnaires were distributed to the technical staff at Silterra. The study found that factors such as participants, trainer, training materials and organization could affect the effectiveness of the training while other factors such as the training program itself, working environment and technology were immaterial. The results also indicated that participants, trainer, training material and the organization had a positive relationship with the effectiveness of training at the different levels of the Kirkpatrick’s evaluation model.
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