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© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Machining chips are directly related to both the machining quality and tool condition. However, detecting chips from images in industrial settings poses challenges in terms of model accuracy and computational speed. We firstly present a novel framework called GM-YOLOv11-DNMS to track the chips, followed by a video-level post-processing algorithm for chip counting in videos. GM-YOLOv11-DNMS has two main improvements: (1) it replaces the CNN layers with a ghost module in YOLOv11n, significantly reducing the computational cost while maintaining the detection performance, and (2) it uses a new dynamic non-maximum suppression (DNMS) method, which dynamically adjusts the thresholds to improve the detection accuracy. The post-processing method uses a trigger signal from rising edges to improve chip counting in video streams. Experimental results show that the ghost module reduces the FLOPs from 6.48 G to 5.72 G compared to YOLOv11n, with a negligible accuracy loss, while the DNMS algorithm improves the debris detection precision across different YOLO versions. The proposed framework achieves precision, recall, and [email protected] values of 97.04%, 96.38%, and 95.56%, respectively, in image-based detection tasks. In video-based experiments, the proposed video-level post-processing algorithm combined with GM-YOLOv11-DNMS achieves crack–debris counting accuracy of 90.14%. This lightweight and efficient approach is particularly effective in detecting small-scale objects within images and accurately analyzing dynamic debris in video sequences, providing a robust solution for automated debris monitoring in machine tool processing applications.

Details

Title
High-Precision Chip Detection Using YOLO-Based Methods
Author
Liu Ruofei 1 ; Zhu Junjiang 2   VIAFID ORCID Logo 

 Center for Balance Architecture, Zhejiang University, Hangzhou 310028, China; [email protected], The Architectural Design & Research Institute of Zhejiang University Co., Ltd., Hangzhou 310028, China 
 College of Mechanical and Electrical Engineering, China Jiliang University, Hangzhou 310018, China 
First page
448
Publication year
2025
Publication date
2025
Publisher
MDPI AG
e-ISSN
19994893
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3233031667
Copyright
© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.