Abstract

In the present era, robust, reliable, and efficient SOCs are the need of the hour due to the rapid growth of IoT, networking, artificial intelligence, and many newer technologies. There is huge competition in the market to decrease the size of the electronic devices. All these market demands have put lots of pressure on silicon industries to accommodate more functionality on a single chip. As a result of this, with time, there is very fast shrinkage in the technology node. But this technology advancement comes with plenty of challenges. One of the primary challenges is undesired on-chip local variations (OCV) & its accurate modeling for timing analysis (STA). This paper discusses all the aspects of timing analysis and the evolution of different methodologies that shape timing analysis over the course of time. The methodologies to define margins for accurate timing analysis is the heart of accurate analysis at lower nodes. The paper will include an emphasis on how the timing analysis have moved from a global derate value to the architecture, condition-based derate value, used through all these methodologies. The paper will focus on the concept of all of the important methodologies and how they have evolved through time.

Details

Title
Timing analysis journey from OCV to LVF
Author
Mahajan, Rita 1 ; Sharma, Aru 1 ; Bansal Manish 2 

 Punjab Engineering College Chandigarh, India 
 STMicroelectronics, Greater Noida, India 
Publication year
2020
Publication date
Dec 2020
Publisher
IOP Publishing
ISSN
17426588
e-ISSN
17426596
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2604018759
Copyright
© 2020. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.