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Copyright © 2022 Ricardo Lopez-Gutierrez et al. This is an open access article distributed under the Creative Commons Attribution License (the “License”), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. https://creativecommons.org/licenses/by/4.0/

Abstract

The detection of faults related to the optimal condition of induction motors is an important task to avoid the malfunction or loss of the motor, thus avoiding high repair or replacement costs and faults in the efficiency of the process to which they belong. These faults are not limited to a single area; mechanical and electrical problems can cause a fault. Specifically, the bearing of a motor is subjected to several effects that cause bearing faults, which cause significant breakdowns in the machinery. This article proposes a methodology for detecting bearing faults on an induction motor. The first part of the methodology uses a signal processing method called empirical wavelet transform (EWT), which decomposes the vibration signal into multiple components to extract a series of amplitude and frequency modulated components (AM-FM) with a Fourier spectrum. First, the vibration signal data are collected in a normal operating condition and the other with bearing damage due to perforation. Then, three types of goodness-of-fit tests are used, Kuiper, Kolmogorov–Smirnov, and Pearson chi-square, to classify the signals and determine which ones belong to a damaged engine. Finally, the experimental results show that the EWT in conjunction with the proposed goodness tests achieves competitive precision and efficiency in diagnosing induction motor-bearing faults.

Details

Title
Induction Machine Bearing Fault Detection Using Empirical Wavelet Transform
Author
Lopez-Gutierrez, Ricardo 1 ; Jose de Jesus Rangel-Magdaleno 1   VIAFID ORCID Logo  ; Morales-Perez, Carlos Javier 2   VIAFID ORCID Logo  ; García-Perez, Arturo 3   VIAFID ORCID Logo 

 Electronics Department, Digital Systems Group (DSG), National Institute for Astrophysics, Optics and Electronics, Puebla, Mexico 
 Electronics Department, Digital Systems Group (DSG), National Institute for Astrophysics, Optics and Electronics, Puebla, Mexico; Mechatronics Department, Universidad Tecnologica de Puebla, Puebla, Mexico 
 Electronics Department, DICIS, Universidad de Guanajuato, Guanajuato, Mexico 
Editor
Marco Cocconcelli
Publication year
2022
Publication date
2022
Publisher
John Wiley & Sons, Inc.
ISSN
10709622
e-ISSN
18759203
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2648808933
Copyright
Copyright © 2022 Ricardo Lopez-Gutierrez et al. This is an open access article distributed under the Creative Commons Attribution License (the “License”), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. https://creativecommons.org/licenses/by/4.0/