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© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Spot blotch (SB) caused by Bipolaris sorokiniana (Sacc.) Shoem is a destructive fungal disease affecting wheat and many other crops. Synthetic hexaploid wheat (SHW) offers opportunities to explore new resistance genes for SB for introgression into elite bread wheat. The objectives of our study were to evaluate a collection of 441 SHWs for resistance to SB and to identify potential new genomic regions associated with the disease. The panel exhibited high SB resistance, with 250 accessions showing resistance and 161 showing moderate resistance reactions. A genome-wide association study (GWAS) revealed a total of 41 significant marker–trait associations for resistance to SB, being located on chromosomes 1B, 1D, 2A, 2B, 2D, 3A, 3B, 3D, 4A, 4D, 5A, 5D, 6D, 7A, and 7D; yet none of them exhibited a major phenotypic effect. In addition, a partial least squares regression was conducted to validate the marker–trait associations, and 15 markers were found to be most important for SB resistance in the panel. To our knowledge, this is the first GWAS to investigate SB resistance in SHW that identified markers and resistant SHW lines to be utilized in wheat breeding.

Details

Title
Genome-Wide Association Study for Spot Blotch Resistance in Synthetic Hexaploid Wheat
Author
Lozano-Ramirez, Nerida 1   VIAFID ORCID Logo  ; Dreisigacker, Susanne 2   VIAFID ORCID Logo  ; Sansaloni, Carolina P 2 ; He, Xinyao 2   VIAFID ORCID Logo  ; Sandoval-Islas, José Sergio 3 ; Pérez-Rodríguez, Paulino 3 ; Aquiles Carballo Carballo 3 ; Cristian Nava Diaz 3 ; Kishii, Masahiro 2 ; Singh, Pawan K 2   VIAFID ORCID Logo 

 International Maize and Wheat Improvement Center (CIMMYT), Texcoco 56237, Mexico; Colegio de Post-Graduados, Montecillo 56230, Mexico 
 International Maize and Wheat Improvement Center (CIMMYT), Texcoco 56237, Mexico 
 Colegio de Post-Graduados, Montecillo 56230, Mexico 
First page
1387
Publication year
2022
Publication date
2022
Publisher
MDPI AG
e-ISSN
20734425
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2706197005
Copyright
© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.