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© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

A dual-excitation uniform eddy current probe, composed of two excitation coils placed tangentially and one detection coil placed horizontally, is developed to solve the difficulties of detection rate and direction recognition of crack defect. Firstly, a probe simulation model is established using COMSOL Multiphysics, and the differences of eddy current distribution between the dual-excitation probe and the traditional probe are investigated. Then, the influence of the distance between excitation coils on sensitivity and the test capability for crack defects with different depths and directions are investigated. Besides, the sensitivity of the dual-excitation probe is compared to that of the traditional probe made of the same coils. Finally, a physical probe and an experimental system are developed, and the performance of the dual-excitation probe is tested. The experimental results show that the probe developed in this paper exhibits a slightly higher sensitivity than the traditional probe for crack defects with different depths in the range of 0.5 mm–4.0 mm; the measurement accuracy of crack length is about 3.0 mm and can avoid missing detection of crack defects with different directions. In testing, the detection signal can be compensated to achieve precision measurement by identifying the angle of crack defects. This dual-excitation uniform eddy current probe can be used for precise quantification and direction identification of crack defect in eddy current testing.

Details

Title
Design and Performance Research of a New Dual-Excitation Uniform Eddy Current Probe
Author
Chen, Tao 1 ; Shi, Hai 1 ; Dong, Yuanhang 1 ; Cheng, Lv 2 ; Deng, Zhiyang 1   VIAFID ORCID Logo  ; Song, Xiaochun 1   VIAFID ORCID Logo  ; Liao, Chunhui 1 

 Key Laboratory of Modern Manufacturing Quantity Engineering, School of Mechanical Engineering, Hubei University of Technology, Wuhan 430068, China 
 Hubei Special Equipment Inspection Testing Institute, Wuhan 430077, China 
First page
8850
Publication year
2022
Publication date
2022
Publisher
MDPI AG
e-ISSN
14248220
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2739457269
Copyright
© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.