Full text

Turn on search term navigation

© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Non-destructive measurements of internal morphological structures in plant materials such as seeds are of high interest in agricultural research. The estimation of pericarp thickness is important to understand the grain quality and storage stability of seeds and can play a crucial role in improving crop yield. In this study, we demonstrate the applicability of fiber-based Bessel beam Fourier domain (FD) optical coherence microscopy (OCM) with a nearly constant high lateral resolution maintained at over ~400 µm for direct non-invasive measurement of the pericarp thickness of two different sorghum genotypes. Whereas measurements based on axial profiles need additional knowledge of the pericarp refractive index, en-face views allow for direct distance measurements. We directly determine pericarp thickness from lateral sections with a 3 µm resolution by taking the width of the signal corresponding to the pericarp at the 1/e threshold. These measurements enable differentiation of the two genotypes with 100% accuracy. We find that trading image resolution for acquisition speed and view size reduces the classification accuracy. Average pericarp thicknesses of 74 µm (thick phenotype) and 43 µm (thin phenotype) are obtained from high-resolution lateral sections, and are in good agreement with previously reported measurements of the same genotypes. Extracting the morphological features of plant seeds using Bessel beam FD-OCM is expected to provide valuable information to the food processing industry and plant breeding programs.

Details

Title
Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy
Author
Sen, Dipankar 1 ; Fernández, Alma 2 ; Crozier, Daniel 3 ; Henrich, Brian 3 ; Sokolov, Alexei V 1   VIAFID ORCID Logo  ; Scully, Marlan O 2 ; Rooney, William L 3   VIAFID ORCID Logo  ; Verhoef, Aart J 2   VIAFID ORCID Logo 

 Department of Physics & Astronomy, Texas A&M University, TAMU 4242, College Station, TX 77843, USA; Institute for Quantum Science & Engineering, Texas A&M University, TAMU 4242, College Station, TX 77843, USA 
 Institute for Quantum Science & Engineering, Texas A&M University, TAMU 4242, College Station, TX 77843, USA; Department of Soil and Crop Sciences, Texas A&M University, TAMU 2474, College Station, TX 77843, USA 
 Department of Soil and Crop Sciences, Texas A&M University, TAMU 2474, College Station, TX 77843, USA 
First page
707
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
14248220
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2767296729
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.