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© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

With the increasing size and complexity of power systems, it is crucial to have an effective protection system in place to ensure its reliability. One of the important components of the protection system are relays. It is important for a relay to operate dependably and securely so that any fault can be cleared in time to minimize damages to the power network. However, it is important to test a relay in a realistic environment before commissioning it to the network. Testing a relay in the actual network can be expensive with limited fault scenarios. Hence, Hardware-in-the-Loop (HIL) testing is an efficient method to perform closed-loop testing of a relay since numerous fault cases can be simulated to provide a realistic operating environment for the relay under test. This paper sheds light on the HIL testing done for protective relays using a sample distribution system using RTDS. Two SEL-351 relays have been used in this experiment, and proper settings for the relays are calculated for coordination. The paper also describes the procedure of configuring the relay and other RTDS components crucial for interfacing of the relay with RTDS. After test setup, a pre-fault, fault, and post-fault analysis was done for the system. The results obtained from these analyses are cross-checked with the event history of the two SEL-351 relays, obtained with AcSELerator Quickset software. This paper provides thorough information for researchers to replicate the presented study or to develop new HIL experiments. It can also help in developing a fundamental understanding of the HIL testing setup that can be further applied to a more complex power system.

Details

Title
Hardware-in-the-Loop Testing for Protective Relays Using Real Time Digital Simulator (RTDS)
Author
Yadav, Gaurav 1   VIAFID ORCID Logo  ; Liao, Yuan 1 ; Burfield, Austin D 2 

 Department of Electrical and Computer Engineering, University of Kentucky, Lexington, KY 40506, USA 
 Schweitzer Engineering Laboratories, Inc., Columbus, OH 43035, USA 
First page
1039
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
19961073
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2774899193
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.