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Abstract

We report tunable RF-sputtered AZO nanofilms through of deposition conditions. Perfect adsorption of light was simulated in ENZ mode. The coupling condition of thickness and wavelength in perfect absorption was obtained by a Drude model. The fitted parameters range as follows: charge density, from 1.6 × 1020 to 4.4 × 1020 cm−3; mobilities, from 8.23 to 12.76 cm2 V−1 s−1; and resistivities, from 14.20 to 34.98 Ω cm. The so-called spectroscopy shape analysis is introduced for automatic detection of elusive XPS peaks and sample surface-etching classification.

Details

Title
Ultrathin tunable conducting oxide films for near-IR applications: an introduction to spectroscopy shape theory
Author
Villarreal-Rios, A. L. 1 ; Bedoya-Calle, Á. H. 2   VIAFID ORCID Logo  ; Caro-Lopera, F. J. 3 ; Ortiz-Méndez, U. 2 ; García-Méndez, M. 1 ; Pérez-Ramírez, F. O. 4 

1  Universidad Autónoma de Nuevo León, Facultad de Ciencias Físico Matemáticas, San Nicolás de los Garza, México (GRID:grid.411455.0) (ISNI:0000 0001 2203 0321) 
2  Universidad Autónoma de Nuevo León, CIIDIT, Apodaca, México (GRID:grid.411455.0) (ISNI:0000 0001 2203 0321) 
3  Universidad de Medellín, Facultad de Ciencias Básicas, Medellín, Colombia (GRID:grid.440796.8) 
4  Universidad de Medellín, Facultad de Ingenierías, Medellín, Colombia (GRID:grid.440796.8) 
Pages
1553
Publication year
2019
Publication date
Dec 2019
Publisher
Springer Nature B.V.
ISSN
25233963
e-ISSN
25233971
Source type
Scholarly Journal
Language of publication
English
DOI
https://doi.org/10.1007/s42452-019-1569-y
ProQuest document ID
2788429349
Copyright
© Springer Nature Switzerland AG 2019.