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© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

High-sensitivity resonator magnetic sensing requires a significant magnetostrictive response, while the narrow linewidth mode of a high-Q resonator can provide a high-precision frequency resolution. Therefore, a polydimethylsiloxane (PDMS) flexible resonator with both a low Young’s modulus and high optical transmittance is an ideal platform for realizing high-sensitivity magnetic sensing. Based on the sandwich structure of the PDMS flexible resonator, the mechanism of the magnetic field sensitivity of the PDMS flexible resonator sandwich structure is studied, and the impact of changes in the refractive index and radius on the sensor device is analyzed. In order to optimize the sensitivity of the sensor, when an external magnetic field acts on the sandwich structure, the impacts of three aspects on the sensitivity of the sensor are simulated and analyzed: different coupling positions of PDMS flexible resonator, different radii, and PDMS mixing ratios. The trend of sensitivity change is obtained, and the physical explanation of the sensitivity trend is analyzed. By optimizing these three aspects, the magnetic field sensitivity is eventually calculated as 19.02 nm/mT. Based on the existing experimental conditions and the preparation technology of the PDMS flexible resonator, the measured magnetic field sensitivity is 4.23 nm/mT.

Details

Title
A High-Sensitivity Magnetic Field Sensor Based on PDMS Flexible Resonator
Author
Rong, Jiamin 1 ; Xu, Weikang 1 ; Xing, Enbo 2 ; Tang, Jun 1 

 School of Semiconductors and Physics, North University of China, Taiyuan 030051, China; [email protected] (W.X.); [email protected] (J.T.) 
 Key Laboratory of Electronic Testing Technology, School of Instrument and Electronics, North University of China, Taiyuan 030051, China; [email protected] 
First page
6274
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
20763417
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2819307100
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.