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© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Digital images have become an important carrier for people to access information in the information age. However, with the development of this technology, digital images have become vulnerable to illegal access and tampering, to the extent that they pose a serious threat to personal privacy, social order, and national security. Therefore, image forensic techniques have become an important research topic in the field of multimedia information security. In recent years, deep learning technology has been widely applied in the field of image forensics and the performance achieved has significantly exceeded the conventional forensic algorithms. This survey compares the state-of-the-art image forensic techniques based on deep learning in recent years. The image forensic techniques are divided into passive and active forensics. In passive forensics, forgery detection techniques are reviewed, and the basic framework, evaluation metrics, and commonly used datasets for forgery detection are presented. The performance, advantages, and disadvantages of existing methods are also compared and analyzed according to the different types of detection. In active forensics, robust image watermarking techniques are overviewed, and the evaluation metrics and basic framework of robust watermarking techniques are presented. The technical characteristics and performance of existing methods are analyzed based on the different types of attacks on images. Finally, future research directions and conclusions are presented to provide useful suggestions for people in image forensics and related research fields.

Details

Title
Review of Image Forensic Techniques Based on Deep Learning
Author
Shi, Chunyin 1   VIAFID ORCID Logo  ; Chen, Luan 1   VIAFID ORCID Logo  ; Wang, Chengyou 2   VIAFID ORCID Logo  ; Zhou, Xiao 2   VIAFID ORCID Logo  ; Qin, Zhiliang 3   VIAFID ORCID Logo 

 School of Mechanical, Electrical and Information Engineering, Shandong University, Weihai 264209, China; [email protected] (C.S.); [email protected] (L.C.); [email protected] (X.Z.); [email protected] (Z.Q.) 
 School of Mechanical, Electrical and Information Engineering, Shandong University, Weihai 264209, China; [email protected] (C.S.); [email protected] (L.C.); [email protected] (X.Z.); [email protected] (Z.Q.); Shandong University–Weihai Research Institute of Industry Technology, Weihai 264209, China 
 School of Mechanical, Electrical and Information Engineering, Shandong University, Weihai 264209, China; [email protected] (C.S.); [email protected] (L.C.); [email protected] (X.Z.); [email protected] (Z.Q.); Weihai Beiyang Electric Group Co., Ltd., Weihai 264209, China 
First page
3134
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
22277390
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2843077511
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.