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© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Aiming at the problems of uneven light reflectivity on the spherical surface and high similarity between the stems/calyxes and scars that exist in the detection of surface defects in apples, this paper proposed a defect detection method based on image segmentation and stem/calyx recognition to realize the detection and recognition of surface defects in apples. Preliminary defect segmentation results were obtained by eliminating the interference of light reflection inhomogeneity through adaptive bilateral filtering-based single-scale Retinex (SSR) luminance correction and using adaptive gamma correction to enhance the Retinex reflective layer, and later segmenting the Retinex reflective layer by using a region-growing algorithm. The texture features of apple surface defects under different image processing methods were analyzed based on the gray level co-occurrence matrix, and a support vector machine was introduced for binary classification to differentiate between stems/calyxes and scars. Deploying the proposed defect detection method into the embedded device OpenMV4H7Plus, the accuracy of stem/calyx recognition reached 93.7%, and the accuracy of scar detection reached 94.2%. It has conclusively been shown that the proposed defect detection method can effectively detect apple surface defects in the presence of uneven light reflectivity and stem/calyx interference.

Details

Title
Apple Surface Defect Detection Based on Gray Level Co-Occurrence Matrix and Retinex Image Enhancement
Author
Yang, Lei 1 ; Mu, Dexu 1   VIAFID ORCID Logo  ; Xu, Zhen 1 ; Huang, Kaiyu 2 

 School of Electrical and Electronic Engineering, Wuhan Polytechnic University, Wuhan 430023, China; [email protected] (L.Y.); [email protected] (Z.X.) 
 School of Electrical Engineering, Wright State University, Dayton, OH 45435, USA; [email protected] 
First page
12481
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
20763417
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2892975149
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.