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© 2024 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

In response to the current issues of poor real-time performance, high computational costs, and excessive memory usage of object detection algorithms based on deep convolutional neural networks in embedded devices, a method for improving deep convolutional neural networks based on model compression and knowledge distillation is proposed. Firstly, data augmentation is employed in the preprocessing stage to increase the diversity of training samples, thereby improving the model’s robustness and generalization capability. The K-means++ clustering algorithm generates candidate bounding boxes, adapting to defects of different sizes and selecting finer features earlier. Secondly, the cross stage partial (CSP) Darknet53 network and spatial pyramid pooling (SPP) module extract features from the input raw images, enhancing the accuracy of defect location detection and recognition in YOLO. Finally, the concept of model compression is integrated, utilizing scaling factors in the batch normalization (BN) layer, and introducing sparse factors to perform sparse training on the network. Channel pruning and layer pruning are applied to the sparse model, and post-processing methods using knowledge distillation are used to effectively reduce the model size and forward inference time while maintaining model accuracy. The improved model size decreases from 244 M to 4.19 M, the detection speed increases from 32.8 f/s to 68 f/s, and mAP reaches 97.41. Experimental results demonstrate that this method is conducive to deploying network models on embedded devices with limited GPU computing and storage resources. It can be applied in distributed service architectures for edge computing, providing new technological references for deploying deep learning models in the industrial sector.

Details

Title
Research on the Construction of an Efficient and Lightweight Online Detection Method for Tiny Surface Defects through Model Compression and Knowledge Distillation
Author
Chen, Qipeng 1 ; Xiong, Qiaoqiao 2 ; Huang, Haisong 3   VIAFID ORCID Logo  ; Tang, Saihong 2 ; Liu, Zhenghong 4 

 Key Laboratory of Advanced Manufacturing Technology, Ministry of Education, Guizhou University, Guiyang 550025, China; [email protected]; School of Mechanical Engineering, Guizhou University, Guiyang 550025, China; School of Mechanical Engineering, Guiyang University, Guiyang 550005, China; [email protected] 
 Department of Mechanical and Manufacturing Engineering, Faculty of Engineering, Universiti Putra Malaysia (UPM), Serdang 43400, Malaysia; Department of Mechanical and Electronic Engineering, Guizhou Communications Polytechnic, Guiyang 551400, China 
 Key Laboratory of Advanced Manufacturing Technology, Ministry of Education, Guizhou University, Guiyang 550025, China; [email protected]; School of Mechanical Engineering, Guizhou University, Guiyang 550025, China 
 School of Mechanical Engineering, Guiyang University, Guiyang 550005, China; [email protected] 
First page
253
Publication year
2024
Publication date
2024
Publisher
MDPI AG
e-ISSN
20799292
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2918725954
Copyright
© 2024 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.