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© 2024 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

This paper presents a practical contamination detection system for camera lenses using image analysis with deep learning. The proposed system can detect contamination in camera digital images through contamination learning utilizing deep learning, and it aims to prevent performance degradation of intelligent vision systems due to lens contamination in cameras. This system is based on the object detection algorithm YOLO (v5n, v5s, v5m, v5l, and v5x), which is trained with 4000 images captured under different lighting and background conditions. The trained models showed that the average precision improves as the algorithm size increases, especially for YOLOv5x, which showed excellent efficiency in detecting droplet contamination within 23 ms. They also achieved an average precision ([email protected]) of 87.46%, recall ([email protected]:0.95) of 51.90%, precision of 90.28%, recall of 81.47%, and F1 score of 85.64%. As a proof of concept, we demonstrated the identification and removal of contamination on camera lenses by integrating a contamination detection system and a transparent heater-based cleaning system. The proposed system is anticipated to be applied to autonomous driving systems, public safety surveillance cameras, environmental monitoring drones, etc., to increase operational safety and reliability.

Details

Title
Deep Learning-Based Multiple Droplet Contamination Detector for Vision Systems Using a You Only Look Once Algorithm
Author
Kim, Youngkwang 1 ; Kim, Woochan 1 ; Yoon, Jungwoo 1 ; Chung, Sangkug 1 ; Kim, Daegeun 2 

 Department of Mechanical Engineering, Myongji University, Yongin 17058, Republic of Korea; [email protected] (Y.K.); [email protected] (W.K.); [email protected] (J.Y.) 
 Microsystems, Inc., Yongin 17058, Republic of Korea 
First page
134
Publication year
2024
Publication date
2024
Publisher
MDPI AG
e-ISSN
20782489
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3002566564
Copyright
© 2024 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.