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GENEVA, April 15 -- EBARA CORPORATION (11-1, Haneda Asahi-cho, Ota-ku, Tokyo1448510), 株式会社荏原製作所 (東京都大田区羽田旭町11番1号) filed a patent application (PCT/JP2023/031690) for "DATA PROCESSING SYSTEM, DATA COLLECTION DEVICE, PHYSICAL QUANTITY MEASUREMENT DEVICE, DATA PROCESSING METHOD, DATA COLLECTION METHOD, DATA PRESENTATION METHOD, AND DATA STRUCTURE" on Aug 31, 2023. With publication no. WO/2024/075444, the details related to the patent application was published on Apr 11, 2024.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): SAKAMAKI Yuta (c/o EBARA CORPORATION, 11-1, Haneda Asahi-cho, Ota-ku, Tokyo1448510), 坂巻 裕太 (東京都大田区羽田旭町11番1号 株式会社荏原製作所内), YAMADA Yasumasa (c/o EBARA CORPORATION, 11-1, Haneda Asahi-cho, Ota-ku, Tokyo1448510), 山田 泰雅 (東京都大田区羽田旭町11番1号 株式会社荏原製作所内), SEKIGUCHI Takashi (c/o EBARA CORPORATION, 11-1, Haneda Asahi-cho, Ota-ku, Tokyo1448510), 関口 孝志 (東京都大田区羽田旭町11番1号 株式会社荏原製作所内)
Abstract: This data processing structure is made up of a plurality of physical quantity measurement devices and a data collection device. Upon accepting a data request including an object identification index from the data collection device, the physical quantity measurement devices transmit, to the data collection device, a physical quantity data array made up of physical quantity data associated with an index of which the measurement order is later than the object identification index and an index therefor, out of a plurality of physical quantity data and indices stored in a storage unit. When a predetermined collection condition is satisfied, the data collection device transmits a data request including the object identification index to the physical quantity measurement devices, receives a physical quantity data array as a response thereto, and identifies and manages an index of which the measurement order is last when receiving the physical quantity data array the previous time, as the object identification index. For more information:https://patentscope.wipo.int/search/en/detail.jsf?docId=WO2024075444
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