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© 2024 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Identifying underperforming photovoltaic (PV) modules is crucial to ensure optimal energy production and financial returns, as well as preventing potential safety hazards in case of severe damage. To this aim, current–voltage (I-V) curve tracing can be employed as in situ monitoring technique for the early detection of faults. In this paper, we introduce a novel low-cost, microcontroller-based I-V tracer for the diagnosis of individual PV modules. The tool features a unique power conditioning circuit, facilitating accurate data acquisition under static conditions as well as the even distribution of the measured points along the I-V curve. A specific active disconnecting circuit enables in situ and on-line measurement without interrupting the string power generation. The designed prototype is used to characterize a set of PV modules under real operating conditions. The measured I-V curves exhibit expected trends, with the measured data closely matching theoretical values and an estimated mean relative error less than 3%.

Details

Title
Design of a Portable Low-Cost I-V Curve Tracer for On-Line and In Situ Inspection of PV Modules
Author
De Riso, Monica 1   VIAFID ORCID Logo  ; Dhimish, Mahmoud 2 ; Guerriero, Pierluigi 2   VIAFID ORCID Logo  ; Santolo Daliento 2 

 Department of Electrical Engineering and Information Technology, University of Naples Federico II, 80138 Napoli, Italy; [email protected]; Laboratory of Photovoltaics, School of Physics, Engineering and Technology, University of York, York YO10 5DD, UK; [email protected] (P.G.); [email protected] (S.D.) 
 Laboratory of Photovoltaics, School of Physics, Engineering and Technology, University of York, York YO10 5DD, UK; [email protected] (P.G.); [email protected] (S.D.) 
First page
896
Publication year
2024
Publication date
2024
Publisher
MDPI AG
e-ISSN
2072666X
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3085030918
Copyright
© 2024 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.