Content area

Abstract

{This paper proposes an angle measurement method based on Electronic Speckle Pattern Interferometry (ESPI) using a Michelson interferometer. By leveraging different principles within the same device, this method achieves complementary advantages across various angle ranges, enhancing measurement accuracy while maintaining high robustness. By utilizing CCD to record light field information in real time and combining geometric and ESPI methods, relationships between small angles and light field information are established, allowing for the design of relevant algorithms for real-time angle measurement. Numerical simulations and experiments were conducted to validate the feasibility and practicality of this method. Results indicate that it maintains measurement accuracy while offering a wide angle measurement range, effectively addressing the limitations of small angle measurements in larger ranges, showcasing significant potential for widespread applications in related fields.

Details

1009240
Title
Angle measurement method of electronic speckle interferometry based on Michelson interferometer
Publication title
arXiv.org; Ithaca
Publication year
2024
Publication date
Nov 20, 2024
Section
Physics (Other)
Publisher
Cornell University Library, arXiv.org
Source
arXiv.org
Place of publication
Ithaca
Country of publication
United States
University/institution
Cornell University Library arXiv.org
e-ISSN
2331-8422
Source type
Working Paper
Language of publication
English
Document type
Working Paper
Publication history
 
 
Online publication date
2024-11-21
Milestone dates
2024-11-20 (Submission v1)
Publication history
 
 
   First posting date
21 Nov 2024
ProQuest document ID
3131612039
Document URL
https://www.proquest.com/working-papers/angle-measurement-method-electronic-speckle/docview/3131612039/se-2?accountid=208611
Full text outside of ProQuest
Copyright
© 2024. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
Last updated
2024-11-22
Database
ProQuest One Academic