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Abstract

Wavelet-based edge detection methods have evolved significantly over the years, contributing to advances in image processing, computer vision, and pattern recognition. This paper proposes a new local optimal spline wavelet (LOSW) and the dual wavelet of the LOSW. Then, a pair of dual filters can be obtained, which can provide distortion-free signal decomposition and reconstruction, while having stronger denoising and feature capture capabilities. The coefficients of the pair of dual filters are calculated for image edge detection. We propose a new LOSW-based edge detection algorithm (LOSW-ED), which introduces a structural uncertainty–aware modulus maxima (SUAMM) to detect highly uncertain edge samples, ensuring robustness in complex and noisy environments. Additionally, LOSW-ED unifies multi-structure morphology and modulus maxima to fully exploit the complementary properties of low-frequency (LF) and high-frequency (HF) components, enabling multi-stage differential edge refinement. The experimental results show that the proposed LOSW and LOSW-ED algorithm has better performance in noise suppression and edge structure preservation.

Details

1009240
Title
A New Local Optimal Spline Wavelet for Image Edge Detection
Author
Zhou, Dujuan 1   VIAFID ORCID Logo  ; Yuan, Zizhao 2   VIAFID ORCID Logo  ; Cai, Zhanchuan 3   VIAFID ORCID Logo  ; Zhu, Defu 4   VIAFID ORCID Logo  ; Shen, Xiaojing 5   VIAFID ORCID Logo 

 School of Computer Science and Engineering, Macau University of Science and Technology, Taipa, Macau, China; [email protected]; School of Mathematics, Physics and Civil Engineering, Beijing Institute of Technology, Zhuhai 519088, China; [email protected] 
 School of Mathematics, Physics and Civil Engineering, Beijing Institute of Technology, Zhuhai 519088, China; [email protected] 
 School of Computer Science and Engineering, Macau University of Science and Technology, Taipa, Macau, China; [email protected] 
 Key Laboratory of In-Situ Property-Improving Mining of Ministry of Education, Taiyuan University of Technology, Taiyuan 030024, China; [email protected]; Galuminium Group Co., Ltd., Guangzhou 510450, China 
 Faculty of Data Science, City University of Macau, Macau, China; [email protected] 
Publication title
Volume
13
Issue
1
First page
42
Publication year
2025
Publication date
2025
Publisher
MDPI AG
Place of publication
Basel
Country of publication
Switzerland
Publication subject
e-ISSN
22277390
Source type
Scholarly Journal
Language of publication
English
Document type
Journal Article
Publication history
 
 
Online publication date
2024-12-26
Milestone dates
2024-11-07 (Received); 2024-12-25 (Accepted)
Publication history
 
 
   First posting date
26 Dec 2024
ProQuest document ID
3153800413
Document URL
https://www.proquest.com/scholarly-journals/new-local-optimal-spline-wavelet-image-edge/docview/3153800413/se-2?accountid=208611
Copyright
© 2024 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
Last updated
2025-01-10
Database
ProQuest One Academic