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© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

In this study, long-term reliability tests for high-power-density photovoltaic (PV) modules were introduced and analyzed in accordance with IEC 61215 and light-combined damp heat cycles, such as DIN 75220. The results indicated that post light soaking procedure, light-combined damp heat cycles caused a 3.51% power drop, while IEC standard tests (DH1000 and TC200) caused only 0.87% and 1.32% power drops, respectively. IEC 61215 failed to assess the long-term reliability of the high-power-density PV module, such as the passivated emitter rear cell. Additionally, based on the combined test, the latent heat (Qmod) of the module was introduced to predict its degradation rate and to fit the prediction curve of the product guaranteed by the PV module manufacturers. Qmod facilitates in predicting a PV module’s lifespan according to the environmental factors of the actual installation area. The Qmod values of the PV stations in water environments, such as floating and/or marine PVs, indicated that they would last 7.2 years more than those on a rooftop, assuming that latent heat is the only cause of deterioration. Therefore, extending module life and improving power generation efficiency by determining installation sites to minimize latent heat would be advantageous.

Details

Title
Predicting Photovoltaic Module Lifespan Based on Combined Stress Tests and Latent Heat Analysis
Author
Nam, Woojun 1 ; Choi, Jinho 1   VIAFID ORCID Logo  ; Kim, Gyugwang 1 ; Hyun, Jinhee 1 ; Ahn, Hyungkeun 1   VIAFID ORCID Logo  ; Park, Neungsoo 2   VIAFID ORCID Logo 

 Next Generation Photovoltaic Module and Power System Research Center, Konkuk University, Seoul 05029, Republic of Korea; [email protected] (W.N.); [email protected] (J.C.); [email protected] (G.K.); [email protected] (J.H.); [email protected] (H.A.) 
 The Department of Computer Science & Engineering, Konkuk University, Seoul 05029, Republic of Korea 
First page
304
Publication year
2025
Publication date
2025
Publisher
MDPI AG
e-ISSN
19961073
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3159623393
Copyright
© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.