Rietveld Refinement of Electron Diffraction Patterns of Nanocrystalline Materials Using MAUD: Two-Beam Dynamical Correction Implementation and Applications

Abstract

Nanocrystalline (NC) materials have widespread industrial usage. X-ray and neutron diffraction techniques are primary tools for studying the structural and microstructural features of NC materials. Selected area electron diffraction (SAED) patterns collected using a transmission electron microscope (TEM) on polycrystalline nanostructured materials, featuring nested rings, that are analogous to Debye–Scherrer patterns, possess similar potentials to aid materials characterisation. The utility of SAED patterns is further enhanced by the possibility of applying crystallographic approaches, like full pattern fitting procedures, based on Rietveld refinement algorithms, enabling the evaluation of material features, such as crystallite size, lattice distortions, defect structures, and the presence of secondary phases even from very small volume scale. In this paper, we have discussed the possibilities afforded by a Rietveld code applied to SAED patterns of NC materials, including the mathematical implementation of the two-beam dynamical correction model in MAUD software (version 2.9995), and a critical discussion of the results obtained on different NC materials.