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Abstract

As the demand for high-precision measurements of refractive index variations in marine environments increases, eliminating potential sources of measurement errors has become an urgent issue. One of these error sources is the impact of optical path length perturbations. This study investigates the effect of optical path perturbations on the accuracy of the measurements using the interference method. By establishing an error analysis model, this study analyzes the systematic errors induced by optical path perturbations and verifies the error patterns under different refractive index variations through simulations and experiments. The results show that the errors introduced by optical path perturbations are linearly related to the magnitude of the perturbations, and the error increases as the magnitude of the perturbation grows. The error becomes negligible when the magnitude of the optical path perturbations relative to the measurement zone length is one order of magnitude smaller than the refractive index measurement accuracy. The experimental and simulation results are consistent, validating the accuracy of the model. This indicates that in high-precision seawater refractive index measurements using the interference method, perturbations in the measurement region cannot be ignored, and it is difficult to achieve higher measurement precision through physical vibration isolation alone, highlighting the urgent need for new solutions.

Details

1009240
Business indexing term
Title
Influence of Geometric Length Perturbation of Optical Path on Measurement Error of Seawater Refractive Index
Author
Zhang, Xinyi 1   VIAFID ORCID Logo  ; Zhao, Jiaxin 2 ; Wang, Hu 3 ; Li, Liyan 3   VIAFID ORCID Logo  ; Fan, Songtao 3 ; Wang, Yongjie 3   VIAFID ORCID Logo  ; Zhou, Yan 3 

 Optoelectronic Systems Laboratory, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; [email protected] (X.Z.); [email protected] (J.Z.); [email protected] (H.W.); [email protected] (S.F.); [email protected] (Y.W.); College of Materials Science and Optoelectronics Technology, University of Chinese Academy of Sciences, Beijing 100049, China 
 Optoelectronic Systems Laboratory, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; [email protected] (X.Z.); [email protected] (J.Z.); [email protected] (H.W.); [email protected] (S.F.); [email protected] (Y.W.); School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China 
 Optoelectronic Systems Laboratory, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; [email protected] (X.Z.); [email protected] (J.Z.); [email protected] (H.W.); [email protected] (S.F.); [email protected] (Y.W.) 
Volume
13
Issue
3
First page
473
Publication year
2025
Publication date
2025
Publisher
MDPI AG
Place of publication
Basel
Country of publication
Switzerland
Publication subject
e-ISSN
20771312
Source type
Scholarly Journal
Language of publication
English
Document type
Journal Article
Publication history
 
 
Online publication date
2025-02-28
Milestone dates
2025-01-31 (Received); 2025-02-25 (Accepted)
Publication history
 
 
   First posting date
28 Feb 2025
ProQuest document ID
3181552370
Document URL
https://www.proquest.com/scholarly-journals/influence-geometric-length-perturbation-optical/docview/3181552370/se-2?accountid=208611
Copyright
© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
Last updated
2025-03-27
Database
ProQuest One Academic