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Abstract

Fast mechanical switches (FMSs) are critical components of DC circuit breakers (DCCBs), which require the switch action time to break to a sufficient distance within 3 ms in the DC line breaking scenario, while ensuring a long service life. The breaking mechanism significantly affects the current interruption capability of DCCBs. The operation of the repulsion mechanism, along with the morphology of the arc and its transformation within the interrupter chamber, collectively influence the breaking performance of the FMSs. This paper presents a comprehensive analysis of the FMSs, which serves as the pivotal component of controlled resonance combination circuit breakers (CRCBs). This study establishes a multi physics coupling simulation analysis method based on the equivalent circuit of repulsion mechanism discharge, combined with electromagnetic and solid mechanics fields. By constructing a full cycle magnetohydrodynamic particle arc (MHP) model and using a combined simulation of Finite Element joint model (FEJM), the evolution law of arc characteristics during the superimposed current interruption process was systematically explored. The focus was on analysing the physical process of the zero zone of the superimposed arc, the multi physics field coupling relationship of the arc, and the interaction mechanism with external characteristic parameters. Further combining with optimisation design methods, the effectiveness of the model was verified through experiments, FEJM provides comprehensive technical support for effectively reflecting the stress issues of core components during the breaking process of FMS and can provide accurate theoretical references for the optimisation design of mechanical motion components in FMS. It also accurately represents the arc extinguishing process during the breaking of FMS and provides a convenient method for the selection and design of circuit parameters for the entire circuit breaker.

Details

1009240
Title
Finite element joint simulation model applied to fast mechanical switching of controlled resonance combination circuit breakers
Author
Cui, Puyi 1   VIAFID ORCID Logo  ; Li, Guoli 2 ; Sun, Zehui 3 ; Xu, Jiazi 3 ; Zhang, Guoyong 4 ; Chen, Zhong 5 ; Guan, Weiping 5 

 School of Electrical Engineering and Automation, Anhui University, Hefei, China, Engineering Research Center of Power Quality, Ministry of Education, Anhui University, Hefei, China 
 Anhui Key Laboratory of Industrial Energy‐Saving and Safety, Anhui University, Hefei, China, Anhui Collaborative Innovation Center of Industrial Energy‐Saving and Power Quality Control, Anhui University, Hefei, China 
 School of Electrical Engineering and Automation, Anhui University, Hefei, China, Anhui Key Laboratory of Industrial Energy‐Saving and Safety, Anhui University, Hefei, China 
 Anhui Zhengguangdian Electric Power Technology Co., Hefei, China 
 Electric Power Research Institute of State Grid Anhui Electric Power Co., Ltd., Hefei, China 
Publication title
High Voltage; Beijing
Volume
10
Issue
2
Pages
419-435
Publication year
2025
Publication date
Apr 1, 2025
Section
ORIGINAL RESEARCH
Publisher
John Wiley & Sons, Inc.
Place of publication
Beijing
Country of publication
United States
ISSN
23977264
Source type
Scholarly Journal
Language of publication
English
Document type
Journal Article
Publication history
 
 
Online publication date
2025-04-16
Milestone dates
2024-09-27 (manuscriptRevised); 2025-04-30 (publishedOnlineFinalForm); 2024-06-19 (manuscriptReceived); 2025-04-16 (publishedOnlineEarlyUnpaginated); 2024-10-28 (manuscriptAccepted)
Publication history
 
 
   First posting date
16 Apr 2025
ProQuest document ID
3212670741
Document URL
https://www.proquest.com/scholarly-journals/finite-element-joint-simulation-model-applied/docview/3212670741/se-2?accountid=208611
Copyright
© 2025. This work is published under http://creativecommons.org/licenses/by/4.0/ (the "License"). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
Last updated
2025-05-28
Database
2 databases
  • ProQuest One Academic
  • ProQuest One Academic