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GENEVA, June 10 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/029083) for "DATA COLLECTION DEVICE, DATA COLLECTION METHOD, AND DATA COLLECTION SYSTEM" on Aug 15, 2024. With publication no. WO/2025/115306, the details related to the patent application was published on Jun 05, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): URANO Kotoko (c/o HITACHI, LTD., 6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008280), 浦野 琴子 (東京都千代田区丸の内一丁目６番６号 株式会社日立製作所内), KURATA Sayaka (c/o HITACHI, LTD., 6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008280), 倉田 明佳 (東京都千代田区丸の内一丁目６番６号 株式会社日立製作所内), OOMINAMI Yuusuke (c/o HITACHI HIGH-TECH CORPORATION, 17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 大南 祐介 (東京都港区虎ノ門一丁目１７番１号 株式会社日立ハイテク内), YAMAMOTO Hiroyuki (c/o HITACHI, LTD., 6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008280), 山本 浩之 (東京都千代田区丸の内一丁目６番６号 株式会社日立製作所内)
Abstract: The present invention constructs a database that stores and manages measurement data obtained by a plurality of measurement devices for the same material and feature quantity data obtained by analyzing the measurement data in association with information that identifies the material. According to the present invention, a data collection device that collects measurement data acquired by a measurement device has a database that stores material data that includes feature information about a material to be measured and identification information that identifies the material, a measurement recipe distributor that distributes a measurement recipe that includes the identification information and information about an acquisition procedure for measurement data to a control device that controls the measurement device, a data lake that stores measurement data acquired by the measurement device in accordance with the measurement recipe and supplemental information that includes the identification information and device parameters from the time the data was acquired, and a data correspondence relationship creator that registers the measurement data and the supplemental information stored at the data lake at the database in association with the material data stored at the database on the basis of the identification information as included in the supplemental information. For more information:https://patentscope.wipo.int/search/en/detail.jsf?docId=WO2025115306
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