Content area

Abstract

Conference Title: 2025 IEEE/ACM 47th International Conference on Software Engineering: Companion Proceedings (ICSE-Companion)

Conference Start Date: 2025 April 27

Conference End Date: 2025 May 3

Conference Location: Ottawa, ON, Canada

Fuzzing is a powerful software testing technique renowned for its effectiveness in identifying software vulnerabilities. Traditional fuzzing evaluations typically focus on overall fuzzer performance across a set of target programs, yet few benchmarks consider how fine-grained program features influence fuzzing effectiveness. To bridge this gap, we introduce a novel benchmark designed to generate programs with configurable, fine-grained program features to enhance fuzzing evaluations. We reviewed 25 recent grey-box fuzzing studies, extracting 7 program features related to control-flow and data-flow that can impact fuzzer performance. Using these features, we generated a benchmark consisting of 153 programs controlled by 10 fine-grained configurable parameters. We evaluated 11 popular fuzzers using this benchmark. The results indicate that fuzzer performance varies significantly based on the program features and their strengths, highlighting the importance of incorporating program characteristics into fuzzing evaluations.

Details

Title
Program Feature-Based Fuzzing Benchmarking
Author
Miao, Miao 1 

 University of Texas at Dallas,Department of Computer Science,Richardson,TX,USA 
Pages
232-234
Number of pages
3
Publication year
2025
Publication date
2025
Publisher
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Place of publication
Piscataway
Country of publication
United States
Source type
Conference Paper
Language of publication
English
Document type
Conference Proceedings
Publication history
 
 
Online publication date
2025-06-13
Publication history
 
 
   First posting date
13 Jun 2025
ProQuest document ID
3218510166
Document URL
https://www.proquest.com/conference-papers-proceedings/program-feature-based-fuzzing-benchmarking/docview/3218510166/se-2?accountid=208611
Copyright
Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2025
Last updated
2025-06-14
Database
ProQuest One Academic