Content area

Business indexing term
Title
LossLens: Diagnostics for Machine Learning Through Loss Landscape Visual Analytics
Author
Xie, Tiankai 1   VIAFID ORCID Logo  ; Chen, Jiaqing 1   VIAFID ORCID Logo  ; Yang, Yaoqing 2   VIAFID ORCID Logo  ; Geniesse, Caleb 3   VIAFID ORCID Logo  ; Shi, Ge 4   VIAFID ORCID Logo  ; Chaudhari, Ajinkya Jeevan 4   VIAFID ORCID Logo  ; Cava, John Kevin 1   VIAFID ORCID Logo  ; Mahoney, Michael W 5   VIAFID ORCID Logo  ; Perciano, Talita 3   VIAFID ORCID Logo  ; Weber, Gunther H 3   VIAFID ORCID Logo  ; Maciejewski, Ross 1   VIAFID ORCID Logo 

 Arizona State University, Tempe, AZ, USA 
 Dartmouth College, Hanover, NH, USA 
 Lawrence Berkeley National Laboratory, Berkeley, CA, USA 
 University of California, Davis, Davis, CA, USA 
 University of California at Berkeley, Berkeley, CA, USA 
Publication title
Volume
45
Issue
4
Pages
112-125
Number of pages
14
Publication year
2025
Publication date
2025
Publisher
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Place of publication
Los Alamitos
Country of publication
United States
Publication subject
ISSN
02721716
e-ISSN
15581756
Source type
Scholarly Journal
Language of publication
English
Document type
Journal Article
Publication history
 
 
Online publication date
2024-12-16
Milestone dates
2024-11-20 (Accepted); 2024-12-14 (PrePrint)
Publication history
 
 
   First posting date
16 Dec 2024
ProQuest document ID
3218513002
Document URL
https://www.proquest.com/scholarly-journals/losslens-diagnostics-machine-learning-through/docview/3218513002/se-2?accountid=208611
Copyright
Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2025
Last updated
2025-06-14
Database
ProQuest One Academic