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© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

In lifetime testing, the failure times of highly reliable products under normal usage conditions are often impractically long, making direct reliability assessment impractical. To overcome this, step-stress partially accelerated life testing is employed to reduce testing time while preserving data quality. This paper develops a Bayesian model based on Type II censored data, assuming that item lifetimes follow the Topp–Leone inverted Kumaraswamy distribution, a flexible alternative to classical lifetime models due to its ability to capture various hazard rate shapes and to model bounded and skewed lifetime data more effectively than traditional models observed in real-world reliability data. Bayes estimators of the model parameters and acceleration factor are derived under both symmetric (balanced squared error) and asymmetric (balanced linear exponential) loss functions using informative priors. The novelty of this work lies in the integration of the Topp–Leone inverted Kumaraswamy distribution within the Bayesian step-stress partially accelerated life testing framework, which has not been explored previously, offering improved modeling capability for complex lifetime data. The proposed method is validated through comprehensive simulation studies under various censoring schemes, demonstrating robustness and superior estimation performance compared to traditional models. A real-data application involving COVID-19 mortality data further illustrates the practical relevance and improved fit of the model. Overall, the results highlight the flexibility, efficiency, and applicability of the proposed Bayesian approach in reliability analysis.

Details

Title
A Bayesian Approach to Step-Stress Partially Accelerated Life Testing for a Novel Lifetime Distribution
Author
Abd Elaal Mervat K. 1   VIAFID ORCID Logo  ; Mohammad, Hebatalla H 2   VIAFID ORCID Logo  ; Kalantan, Zakiah I 3   VIAFID ORCID Logo  ; EL-Helbawy, Abeer A 4   VIAFID ORCID Logo  ; AL-Dayian, Gannat R 5 ; Behairy, Sara M 5 ; Refaey, Reda M 5 

 Department of Statistics, Faculty of Commerce, Al-Azhar University, (Girls’ Branch), Cairo 11751, Egypt, Canal High Institute of Engineering and Technology, Suez 43511, Egypt 
 Department of Mathematical Sciences, College of Science, Princess Nourah bint Abdulrahman University, P.O. Box 84428, Riyadh 11671, Saudi Arabia 
 Department of Statistics, Faculty of Science, King Abdulaziz University, Jeddah 21589, Saudi Arabia 
 Department of Statistics, Faculty of Commerce, Al-Azhar University, (Girls’ Branch), Cairo 11751, Egypt, Higher Institute of Marketing, Commerce & Information Systems (MCI), Cairo 11511, Egypt 
 Department of Statistics, Faculty of Commerce, Al-Azhar University, (Girls’ Branch), Cairo 11751, Egypt 
First page
476
Publication year
2025
Publication date
2025
Publisher
MDPI AG
e-ISSN
20751680
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3223875688
Copyright
© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.