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Full Text
Scholarly Journal

Widespread misidentification of scanning electron microscope instruments in the peer-reviewed materials science and engineering literature

Richardson, Reese A K

; Moon, Jeonghyun

; Hong, Spencer S

; Nunes Amaral, Luís A

. PLoS One

; San Francisco Vol. 20, Iss. 7, (Jul 2025): e0326754. DOI:10.1371/journal.pone.0326754

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