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Conference Title: 2025 IEEE 15th International Conference on CYBER Technology in Automation, Control, and Intelligent Systems (CYBER)
Conference Start Date: 2025 July 15
Conference End Date: 2025 July 18
Conference Location: Shanghai, China
In industrial Wire Arc Additive Manufacturing (WAAM)., the scarcity and imbalance of labeled defect images limit the effectiveness of deep learning-based quality inspection systems. This paper presents a hybrid CVAE-CGAN framework designed to generate high-resolution., class-conditional molten pool images for data augmentation in small-sample settings. By combining a conditional variational autoencoder with adversarial training and integrating VGG19-based perceptual loss and sub-pixel convolution, the proposed model produces visually realistic and diverse synthetic defect images. Extensive experiments on a nine-class WAAM defect dataset demonstrate the model's ability to enhance classification performance, especially for underrepresented categories, offering a scalable solution to mitigate data limitations in intelligent manufacturing.
Details
1 School of Mechanical, Materials, Mechatronic and Biomedical Engineering, University of Wollongong,Wollongong,NSW,Australia,2522
2 School of Mechanical and Power Engineering, Nanjing Tech University,Nanjing,China,211816