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Abstract

The electronic transport behavior in ferromagnetic thin films critically dictates the functionality and efficiency of devices in spintronics and modern materials science. This work characterizes terahertz (THz) responses and nonlinear conductivities of Fe ultrathin films under high-field THz excitation. We demonstrated that different nonlinearities are present for two different thickness samples. For a 2 nm thick Fe film, as the peak THz electric field was increased to 369 kV/cm, the THz transmittance of Fe films generally decreased. However, for the 4 nm thick Fe film, the THz transmittance is almost field strength independent. This result is correlated with the conductivity variations induced by carrier transport processes. The real part of the complex conductivity for the 2 nm thick film increased significantly with the THz electric field, while the 4 nm thick film showed negligible dependence. In addition, we extracted the frequency-domain complex conductivity of the Fe thin films and used the Drude or Drude–Smith model to explain the distinct behaviors between the two thickness samples under intense THz fields, mainly associated with the surface morphology. This work aims to elucidate the transport properties of Fe films in the THz frequency range. Our findings lay a crucial foundation for the design and development of future high-performance THz spintronic functional devices.

Details

1009240
Title
High-Field Nonlinear Terahertz Conductivities of Iron Ultrathin Films
Author
Zhu Lewen 1 ; Lan Zhiqiang 1 ; Guo Yingyu 1 ; Li, Danni 1 ; Lin, Xi 2 ; Zhang, Huiping 3   VIAFID ORCID Logo  ; Jin Zuanming 3 

 Shanghai Key Lab of Modern Optical System, Terahertz Spectrum and Imaging Technology Cooperative Innovation Center, Terahertz Technology Innovation Research Institute, University of Shanghai for Science and Technology, Shanghai 200093, China; [email protected] (L.Z.); 
 Anjieli Electronic Technology (Suzhou) Co., Ltd., No. 188, Lushan Road, Suzhou 215000, China 
 Shanghai Key Lab of Modern Optical System, Terahertz Spectrum and Imaging Technology Cooperative Innovation Center, Terahertz Technology Innovation Research Institute, University of Shanghai for Science and Technology, Shanghai 200093, China; [email protected] (L.Z.);, Shanghai Institute of Intelligent Science and Technology, Tongji University, Shanghai 200092, China 
Publication title
Volume
15
Issue
18
First page
1386
Number of pages
11
Publication year
2025
Publication date
2025
Publisher
MDPI AG
Place of publication
Basel
Country of publication
Switzerland
Publication subject
e-ISSN
20794991
Source type
Scholarly Journal
Language of publication
English
Document type
Journal Article
Publication history
 
 
Online publication date
2025-09-09
Milestone dates
2025-08-10 (Received); 2025-09-06 (Accepted)
Publication history
 
 
   First posting date
09 Sep 2025
ProQuest document ID
3254614709
Document URL
https://www.proquest.com/scholarly-journals/high-field-nonlinear-terahertz-conductivities/docview/3254614709/se-2?accountid=208611
Copyright
© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
Last updated
2025-09-26
Database
ProQuest One Academic