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Abstract

In the detection of small targets such as insulator defects and flashovers, the existing YOLOv11 has problems such as insufficient feature extraction and difficulty in balancing model lightweight and detection accuracy. We propose a lightweight architecture called FocusNet based on YOLOv11n. To improve the feature expression ability of small targets, Aggregation Diffusion Neck is designed to achieve deep integration and optimization of features at different levels through multiple rounds of multi-scale feature fusion and scale adaptation, and Focus module is introduced to focus on and strengthen the key features of small targets. On this basis, to achieve efficient deployment, the Group-Level First-Order Taylor Expansion Importance Assessment Method is proposed to eliminate channels that have little impact on detection accuracy to streamline the model structure. Then, Channel Distribution Distillation compensates for the slight accuracy loss caused by pruning, and finally achieves the dual optimization of high accuracy and high efficiency. Furthermore, we analyze the interpretability of FocusNet via heatmaps generated by KPCA-CAM. Experiments show that FocusNet achieves 98.50% precision and 99.20% [email protected] on a proprietary insulator defect detection database created for this project using only 3.80 GFLOPs. This research provides reliable technical support for insulator monitoring in power systems.

Details

1009240
Business indexing term
Title
FocusNet: A Lightweight Insulator Defect Detection Network via First-Order Taylor Importance Assessment and Knowledge Distillation
Author
Jing Yurong 1   VIAFID ORCID Logo  ; Tao Zhiyong 1   VIAFID ORCID Logo  ; Sen, Lin 2   VIAFID ORCID Logo 

 School of Electronic and Information Engineering, Liaoning Technical University, Huludao 125105, China; [email protected] 
 School of Automation and Electrical Engineering, Shenyang Ligong University, Shenyang 110168, China; [email protected] 
Publication title
Algorithms; Basel
Volume
18
Issue
10
First page
649
Number of pages
24
Publication year
2025
Publication date
2025
Publisher
MDPI AG
Place of publication
Basel
Country of publication
Switzerland
Publication subject
e-ISSN
19994893
Source type
Scholarly Journal
Language of publication
English
Document type
Journal Article
Publication history
 
 
Online publication date
2025-10-16
Milestone dates
2025-08-22 (Received); 2025-10-14 (Accepted)
Publication history
 
 
   First posting date
16 Oct 2025
ProQuest document ID
3265821513
Document URL
https://www.proquest.com/scholarly-journals/focusnet-lightweight-insulator-defect-detection/docview/3265821513/se-2?accountid=208611
Copyright
© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
Last updated
2025-10-31
Database
ProQuest One Academic