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A novel dual-face hot-roll inlaying process was developed to fabricate a Ag/Cu through-layered composite. The Ag and Cu layers had the same textural components (copper, brass, and S-type components). However, no well-matched crystallographic orientation relationship was identified at the Ag/Cu interface. The width of the elemental interdiffusion layer is generally less than 2 μm. The Ag/Cu interface bonding strength surpasses the tensile strength of Ag (260 MPa), and each interface contributes an increase of 1.1% to the electrical resistivity of the composite.
This Ag/Cu through-layered composite is a promising candidate for use as a substitute for pure Ag in the fabrication of melt elements in fuses, and it is commercially available. A novel dual-face hot-roll inlaying technique was developed to fabricate a Ag/Cu through-layered composite for use in melt elements for fuse production, including two stages of grooving in a Cu strip followed by separate inlaying of Ag strips at the same positions on the opposite surfaces. The microstructure was characterized using field emission scanning electron microscopy (FE-SEM), electron probe microanalysis (EPMA), X-ray diffraction (XRD), and selective area electron diffraction (SAED). The Ag/Cu interfaces are flat and well bonded, with an elemental interdiffusion layer of less than 2 μm. The same textural components—copper, brass, and S-type components—were identified in both the Ag and Cu layers. However, no well-matched crystal orientation relationship between Ag and Cu was detected at the interface. Moreover, tensile properties and electrical resistance were measured to evaluate the bonding strength and conductivity of the interface. It was found that Ag/Cu bonding strength surpassed the tensile strength of Ag, i.e., 260 MPa. While the total elongation is less than 1%, the Ag layer exhibits excellent plasticity, with a section shrinkage over 90%. Compared with the calculated resistivity with a series circuit model, the tested value of the composite sample, including six Ag/Cu interfaces, increased by only 6.6%, indicating good conductivity of the Ag/Cu interface. Therefore, the obtained composite is a promising candidate for the fabrication of melt elements.
Details
Cold;
Tensile properties;
Multilayers;
Electron probe microanalysis;
Electrical installations;
Bonding strength;
Silver;
Copper;
Crystallography;
Electrical resistivity;
Intermetallic compounds;
Laminates;
Composite materials;
Annealing;
Electron diffraction;
Continuous casting;
Oxidation;
Interdiffusion;
Temperature;
Field emission microscopy;
Hot rolling;
Electric fuses;
Tensile strength;
Brasses;
Friction welding;
Interfaces
; Yang, Quanzhen 2 ; Guo Kunshan 3 ; Liu Tianhao 3 ; Zhao, Xue 3 ; Huang, Lei 3 ; Ruan Haiguang 3 ; Zhou, Xiaorong 3 ; Chen, Yi 2 1 College of Materials Science & Engineering, Chongqing University, Chongqing 400045, China; [email protected] (Q.Y.); [email protected] (Y.C.), National Engineering Research Center for Magnesium Alloys, Chongqing University, Chongqing 400045, China, International Joint Laboratory for Light Alloys (MOE), Chongqing University, Chongqing 400045, China
2 College of Materials Science & Engineering, Chongqing University, Chongqing 400045, China; [email protected] (Q.Y.); [email protected] (Y.C.), National Engineering Research Center for Magnesium Alloys, Chongqing University, Chongqing 400045, China
3 Chongqing Chuanyi Metallic Functional Materials Co., Ltd., Chongqing 400702, China; [email protected] (K.G.); [email protected] (T.L.); [email protected] (X.Z.); [email protected] (L.H.); [email protected] (H.R.); [email protected] (X.Z.)